Ph.D., Electrical Engineering
Oklahoma State University, 2010


M.S., Electrical Engineering
Oklahoma State University, 2004


B.S., Electronics and Communication Eng.
University of Madras, 2002


Areas of Interest


  • Statistical Electromagnetics

  • Electromagnetic Characterization and Application of Reverberation Chambers

  • Validation and Optimization Techniques for Computational Electromagnetics

  • Antenna systems and radio frequency (RF) design

  • EMI/C Issues with Unmanned Aerial Systems

Asia-Pacific International Symposium on Electromagnetic Compatibility and Signal Integrity, Shenzhen, China
May 18 - 21, 2016
2016 IEEE Symposium on Electromagnetic Compatibility, Ottawa, Canada
July 25 - 29, 2016


EMC Europe - International Symposium and Exhibition on Electromagnetic Compatibility, Wroclaw, Poland 
September 5 - 9, 2016


A combined measurement and simulation approach was used to assess the effectiveness of absorber materials and make predictions about the performance of the absorber materials under different operating conditions. A first scale model of the equipment with operating electronics (represented by a metallic cavity and a source antenna) was used in the study. The quality factor ‘Q’ of a physically small but electrically large cavity at the frequencies of interest was measured. Then the cavity was loaded with absorbers, and the effects of loading on Q were assessed. The measured results are used as training data for developing an ANN model, and predictions (i.e., simulated measurements) are made for different loading conditions

The motivation behind this exercise was to develop a probability distribution model for the current on the wire due to change in random variables in reagrds to external electromagnetic effects. The Weibull distribution, a two parameter distribution (scale-k and shape-λ) is chosen to analyze the distribution of the current due to its adaptability. The major focus of this work was on the development of the methodology that is sufficiently general to obtain the distribution of any observable due to external EMI.